 |
|
|
|
 |
|
GEM Lenses
Generic Emission Microscope (GEM) lenses are utilized in an advanced
class of
microscopes that look for near-infrared thermal signals given off from
faulty integrated circuits. GEM lenses are designed to look for these
faulty circuits by providing a macro field of view of the sample (at
magnifications ranging from 0.8X to 1.0X).
The lenses are designed over a near-infrared spectrum ranging from 750
to 1150nm. They are of exceptional high numerical aperture (1X/0.40NA
and 0.8X/0.32NA).
The benefit of such lenses is they offer rapid full field inspection of
a large field-of-view. After identification has been established, high
magnifying objectives can be used to examine details of the circuit.
|
|
|